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An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance

This paper describes the development of an automated potentiometric measurement system that is used to compare the quantized Hall resistance with that of wire-wound reference resistors having the same nominal value. Conceptual considerations, along with the major practical problems associated with t...

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Detalles Bibliográficos
Autores principales: Reedtz, Giancarlo Marullo, Cage, Marvin E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1987
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5287006/
http://dx.doi.org/10.6028/jres.092.030
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author Reedtz, Giancarlo Marullo
Cage, Marvin E.
author_facet Reedtz, Giancarlo Marullo
Cage, Marvin E.
author_sort Reedtz, Giancarlo Marullo
collection PubMed
description This paper describes the development of an automated potentiometric measurement system that is used to compare the quantized Hall resistance with that of wire-wound reference resistors having the same nominal value. Conceptual considerations, along with the major practical problems associated with this method, are presented. We then report experimental results which demonstrate that this measurement system is accurate to within a 0.007 ppm one standard deviation uncertainty.
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spelling pubmed-52870062021-08-02 An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance Reedtz, Giancarlo Marullo Cage, Marvin E. J Res Natl Bur Stand (1977) Article This paper describes the development of an automated potentiometric measurement system that is used to compare the quantized Hall resistance with that of wire-wound reference resistors having the same nominal value. Conceptual considerations, along with the major practical problems associated with this method, are presented. We then report experimental results which demonstrate that this measurement system is accurate to within a 0.007 ppm one standard deviation uncertainty. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1987 1987-10-01 /pmc/articles/PMC5287006/ http://dx.doi.org/10.6028/jres.092.030 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Reedtz, Giancarlo Marullo
Cage, Marvin E.
An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title_full An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title_fullStr An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title_full_unstemmed An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title_short An Automated Potentiometric System For Precision Measurement Of the Quantized Hall Resistance
title_sort automated potentiometric system for precision measurement of the quantized hall resistance
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5287006/
http://dx.doi.org/10.6028/jres.092.030
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