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Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor

An evaluation of the unit of resistance maintained at the National Bureau of Standards, based on the prototype standards of length and time, is described. The evaluation is based on a nominally one-picofarad capacitor whose value may be calculated from its mechanical dimensions to high accuracy. Thi...

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Autor principal: Cutkosky, Robert D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1961
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5287274/
https://www.ncbi.nlm.nih.gov/pubmed/32196232
http://dx.doi.org/10.6028/jres.065A.018
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author Cutkosky, Robert D.
author_facet Cutkosky, Robert D.
author_sort Cutkosky, Robert D.
collection PubMed
description An evaluation of the unit of resistance maintained at the National Bureau of Standards, based on the prototype standards of length and time, is described. The evaluation is based on a nominally one-picofarad capacitor whose value may be calculated from its mechanical dimensions to high accuracy. This capacitor is used to calibrate an 0.01-microfarad capacitor. A frequency-dependent bridge involving this capacitor establishes the value of a 10(4)-ohm resistor. Comparison of that resistor with the bank of one-ohm resistors maintaining the NBS unit of resistance establishes that this unit is [Formula: see text] The indicated uncertainty is an estimated 50 percent error of the reported value based on the statistical uncertainty of the measurements and allowing for known sources of possible systematic errors other than in the speed of light, assuming that the speed of light c=2.997925×10(10)cm/sec.
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spelling pubmed-52872742020-03-18 Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor Cutkosky, Robert D. J Res Natl Bur Stand A Phys Chem Article An evaluation of the unit of resistance maintained at the National Bureau of Standards, based on the prototype standards of length and time, is described. The evaluation is based on a nominally one-picofarad capacitor whose value may be calculated from its mechanical dimensions to high accuracy. This capacitor is used to calibrate an 0.01-microfarad capacitor. A frequency-dependent bridge involving this capacitor establishes the value of a 10(4)-ohm resistor. Comparison of that resistor with the bank of one-ohm resistors maintaining the NBS unit of resistance establishes that this unit is [Formula: see text] The indicated uncertainty is an estimated 50 percent error of the reported value based on the statistical uncertainty of the measurements and allowing for known sources of possible systematic errors other than in the speed of light, assuming that the speed of light c=2.997925×10(10)cm/sec. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1961 1961-06-01 /pmc/articles/PMC5287274/ /pubmed/32196232 http://dx.doi.org/10.6028/jres.065A.018 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards Section A is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Cutkosky, Robert D.
Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title_full Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title_fullStr Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title_full_unstemmed Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title_short Evaluation of the NBS Unit of Resistance Based on a Computable Capacitor
title_sort evaluation of the nbs unit of resistance based on a computable capacitor
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5287274/
https://www.ncbi.nlm.nih.gov/pubmed/32196232
http://dx.doi.org/10.6028/jres.065A.018
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