Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry

Various characteristics of evaporated metal-on-fused silica filters are discussed in relation to their optical transmission properties. Special metal holders provided with shutters were designed to be used with these filters, and are described in detail. Transmittance measurements, performed in vari...

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Detalles Bibliográficos
Autor principal: Mavrodineanu, R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1976
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5293530/
https://www.ncbi.nlm.nih.gov/pubmed/32196285
http://dx.doi.org/10.6028/jres.080A.063
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author Mavrodineanu, R.
author_facet Mavrodineanu, R.
author_sort Mavrodineanu, R.
collection PubMed
description Various characteristics of evaporated metal-on-fused silica filters are discussed in relation to their optical transmission properties. Special metal holders provided with shutters were designed to be used with these filters, and are described in detail. Transmittance measurements, performed in various conditions, are reported and indicate that the evaporated metal-on-fused silica filters might present an acceptable material as transfer standards in spectrophotometry.
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spelling pubmed-52935302020-03-18 Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry Mavrodineanu, R. J Res Natl Bur Stand A Phys Chem Article Various characteristics of evaporated metal-on-fused silica filters are discussed in relation to their optical transmission properties. Special metal holders provided with shutters were designed to be used with these filters, and are described in detail. Transmittance measurements, performed in various conditions, are reported and indicate that the evaporated metal-on-fused silica filters might present an acceptable material as transfer standards in spectrophotometry. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1976 1976-08-01 /pmc/articles/PMC5293530/ /pubmed/32196285 http://dx.doi.org/10.6028/jres.080A.063 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards Section A is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Mavrodineanu, R.
Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title_full Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title_fullStr Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title_full_unstemmed Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title_short Considerations for the Use of Semi-Transparent Metallic Thin Films as Potential Transmittance Standards in Spectrophotometry
title_sort considerations for the use of semi-transparent metallic thin films as potential transmittance standards in spectrophotometry
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5293530/
https://www.ncbi.nlm.nih.gov/pubmed/32196285
http://dx.doi.org/10.6028/jres.080A.063
work_keys_str_mv AT mavrodineanur considerationsfortheuseofsemitransparentmetallicthinfilmsaspotentialtransmittancestandardsinspectrophotometry

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