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Aging transition by random errors

In this paper, the effects of random errors on the oscillating behaviors have been studied theoretically and numerically in a prototypical coupled nonlinear oscillator. Two kinds of noises have been employed respectively to represent the measurement errors accompanied with the parameter specifying t...

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Detalles Bibliográficos
Autores principales: Sun, Zhongkui, Ma, Ning, Xu, Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5309892/
https://www.ncbi.nlm.nih.gov/pubmed/28198430
http://dx.doi.org/10.1038/srep42715
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author Sun, Zhongkui
Ma, Ning
Xu, Wei
author_facet Sun, Zhongkui
Ma, Ning
Xu, Wei
author_sort Sun, Zhongkui
collection PubMed
description In this paper, the effects of random errors on the oscillating behaviors have been studied theoretically and numerically in a prototypical coupled nonlinear oscillator. Two kinds of noises have been employed respectively to represent the measurement errors accompanied with the parameter specifying the distance from a Hopf bifurcation in the Stuart-Landau model. It has been demonstrated that when the random errors are uniform random noise, the change of the noise intensity can effectively increase the robustness of the system. While the random errors are normal random noise, the increasing of variance can also enhance the robustness of the system under certain conditions that the probability of aging transition occurs reaches a certain threshold. The opposite conclusion is obtained when the probability is less than the threshold. These findings provide an alternative candidate to control the critical value of aging transition in coupled oscillator system, which is composed of the active oscillators and inactive oscillators in practice.
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spelling pubmed-53098922017-02-22 Aging transition by random errors Sun, Zhongkui Ma, Ning Xu, Wei Sci Rep Article In this paper, the effects of random errors on the oscillating behaviors have been studied theoretically and numerically in a prototypical coupled nonlinear oscillator. Two kinds of noises have been employed respectively to represent the measurement errors accompanied with the parameter specifying the distance from a Hopf bifurcation in the Stuart-Landau model. It has been demonstrated that when the random errors are uniform random noise, the change of the noise intensity can effectively increase the robustness of the system. While the random errors are normal random noise, the increasing of variance can also enhance the robustness of the system under certain conditions that the probability of aging transition occurs reaches a certain threshold. The opposite conclusion is obtained when the probability is less than the threshold. These findings provide an alternative candidate to control the critical value of aging transition in coupled oscillator system, which is composed of the active oscillators and inactive oscillators in practice. Nature Publishing Group 2017-02-15 /pmc/articles/PMC5309892/ /pubmed/28198430 http://dx.doi.org/10.1038/srep42715 Text en Copyright © 2017, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Sun, Zhongkui
Ma, Ning
Xu, Wei
Aging transition by random errors
title Aging transition by random errors
title_full Aging transition by random errors
title_fullStr Aging transition by random errors
title_full_unstemmed Aging transition by random errors
title_short Aging transition by random errors
title_sort aging transition by random errors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5309892/
https://www.ncbi.nlm.nih.gov/pubmed/28198430
http://dx.doi.org/10.1038/srep42715
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