Cargando…
Temperature spectra of conductance of Ge/Si p-i-n structures with Ge quantum dots
This work presents results of investigation of Ge/Si p-i-n structures with Ge quantum dots in the i-region by the method of admittance spectroscopy. The structures contain multiple layers with Ge quantum dots separated by thin 5 nm layers of Si in the intrinsic region. Two peaks are observed on the...
Autores principales: | Izhnin, Ihor I., Fitsych, Olena I., Pishchagin, Anton A., Kokhanenko, Andrei P., Voitsekhovskii, Alexander V., Dzyadukh, Stanislav M., Nikiforov, Alexander I. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2017
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5318315/ https://www.ncbi.nlm.nih.gov/pubmed/28235368 http://dx.doi.org/10.1186/s11671-017-1916-0 |
Ejemplares similares
-
Ge/Si(001) heterostructures with dense arrays of Ge quantum dots: morphology, defects, photo-emf spectra and terahertz conductivity
por: Yuryev, Vladimir A, et al.
Publicado: (2012) -
Initial stage growth of Ge(x)Si(1−x) layers and Ge quantum dot formation on Ge(x)Si(1−x) surface by MBE
por: Nikiforov, Aleksandr I, et al.
Publicado: (2012) -
Admittance Investigation of MIS Structures with HgTe-Based Single Quantum Wells
por: Izhnin, Ihor I., et al.
Publicado: (2016) -
Electromodulated reflectance study of self-assembled Ge/Si quantum dots
por: Yakimov, Andrew, et al.
Publicado: (2011) -
Broadband Ge/SiGe quantum dot photodetector on pseudosubstrate
por: Yakimov, Andrew, et al.
Publicado: (2013)