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Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air
Water adsorbed on a freshly peeled mica crystal causes the loss tangent, D, to increase by 1 to 2 orders of magnitude. The nature of the film is investigated as a function of relative humidity by the measurement of D for the frequency range 100 to 50,000 c/s with a capacitor comprising concentric, p...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1964
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5323088/ https://www.ncbi.nlm.nih.gov/pubmed/31834702 http://dx.doi.org/10.6028/jres.068A.017 |
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author | Ruthberg, S. Frenkel, L. |
author_facet | Ruthberg, S. Frenkel, L. |
author_sort | Ruthberg, S. |
collection | PubMed |
description | Water adsorbed on a freshly peeled mica crystal causes the loss tangent, D, to increase by 1 to 2 orders of magnitude. The nature of the film is investigated as a function of relative humidity by the measurement of D for the frequency range 100 to 50,000 c/s with a capacitor comprising concentric, parallel, circular electrodes of different diameter on opposite sides of the dielectric sheet. This geometry is then analyzed as consisting of the two regions of that within the plates where the electric field, E, is normal to the dielectric plane and that at the edge where tangential E exists. The first is considered in terms of an equivalent circuit for a two layered dielectric. The second is considered in terms of transmission line concepts. It is predicted and verified that the adsorbed film causes the first component to vary as 1/t and the second as √t where t is the thickness of the crystal. Numerical solutions are used to derive the behavior of D, R, and C of the adsorbed film itself. D for the normal direction is ~0.4 and follows a frequency dependency like fresh snow. Resistivities normal to and parallel to cleavage are considerably different while C is much less than expected for a surface film. It is suggested that the surface film is not continuous but instead is localized in patches. |
format | Online Article Text |
id | pubmed-5323088 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1964 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-53230882019-12-10 Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air Ruthberg, S. Frenkel, L. J Res Natl Bur Stand A Phys Chem Article Water adsorbed on a freshly peeled mica crystal causes the loss tangent, D, to increase by 1 to 2 orders of magnitude. The nature of the film is investigated as a function of relative humidity by the measurement of D for the frequency range 100 to 50,000 c/s with a capacitor comprising concentric, parallel, circular electrodes of different diameter on opposite sides of the dielectric sheet. This geometry is then analyzed as consisting of the two regions of that within the plates where the electric field, E, is normal to the dielectric plane and that at the edge where tangential E exists. The first is considered in terms of an equivalent circuit for a two layered dielectric. The second is considered in terms of transmission line concepts. It is predicted and verified that the adsorbed film causes the first component to vary as 1/t and the second as √t where t is the thickness of the crystal. Numerical solutions are used to derive the behavior of D, R, and C of the adsorbed film itself. D for the normal direction is ~0.4 and follows a frequency dependency like fresh snow. Resistivities normal to and parallel to cleavage are considerably different while C is much less than expected for a surface film. It is suggested that the surface film is not continuous but instead is localized in patches. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1964 1964-04-01 /pmc/articles/PMC5323088/ /pubmed/31834702 http://dx.doi.org/10.6028/jres.068A.017 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards Section A is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Ruthberg, S. Frenkel, L. Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title | Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title_full | Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title_fullStr | Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title_full_unstemmed | Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title_short | Dielectric Behavior of the Film Formed on Mica Cleaved in Moist Air |
title_sort | dielectric behavior of the film formed on mica cleaved in moist air |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5323088/ https://www.ncbi.nlm.nih.gov/pubmed/31834702 http://dx.doi.org/10.6028/jres.068A.017 |
work_keys_str_mv | AT ruthbergs dielectricbehaviorofthefilmformedonmicacleavedinmoistair AT frenkell dielectricbehaviorofthefilmformedonmicacleavedinmoistair |