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A Thermal Model for Carbon Nanotube Interconnects

In this work, we have studied Joule heating in carbon nanotube based very large scale integration (VLSI) interconnects and incorporated Joule heating influenced scattering in our previously developed current transport model. The theoretical model explains breakdown in carbon nanotube resistance whic...

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Detalles Bibliográficos
Autores principales: Mohsin, Kaji Muhammad, Srivastava, Ashok, Sharma, Ashwani K., Mayberry, Clay
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5327885/
https://www.ncbi.nlm.nih.gov/pubmed/28348333
http://dx.doi.org/10.3390/nano3020229
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author Mohsin, Kaji Muhammad
Srivastava, Ashok
Sharma, Ashwani K.
Mayberry, Clay
author_facet Mohsin, Kaji Muhammad
Srivastava, Ashok
Sharma, Ashwani K.
Mayberry, Clay
author_sort Mohsin, Kaji Muhammad
collection PubMed
description In this work, we have studied Joule heating in carbon nanotube based very large scale integration (VLSI) interconnects and incorporated Joule heating influenced scattering in our previously developed current transport model. The theoretical model explains breakdown in carbon nanotube resistance which limits the current density. We have also studied scattering parameters of carbon nanotube (CNT) interconnects and compared with the earlier work. For 1 µm length single-wall carbon nanotube, 3 dB frequency in S(12) parameter reduces to ~120 GHz from 1 THz considering Joule heating. It has been found that bias voltage has little effect on scattering parameters, while length has very strong effect on scattering parameters.
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spelling pubmed-53278852017-03-21 A Thermal Model for Carbon Nanotube Interconnects Mohsin, Kaji Muhammad Srivastava, Ashok Sharma, Ashwani K. Mayberry, Clay Nanomaterials (Basel) Article In this work, we have studied Joule heating in carbon nanotube based very large scale integration (VLSI) interconnects and incorporated Joule heating influenced scattering in our previously developed current transport model. The theoretical model explains breakdown in carbon nanotube resistance which limits the current density. We have also studied scattering parameters of carbon nanotube (CNT) interconnects and compared with the earlier work. For 1 µm length single-wall carbon nanotube, 3 dB frequency in S(12) parameter reduces to ~120 GHz from 1 THz considering Joule heating. It has been found that bias voltage has little effect on scattering parameters, while length has very strong effect on scattering parameters. MDPI 2013-04-26 /pmc/articles/PMC5327885/ /pubmed/28348333 http://dx.doi.org/10.3390/nano3020229 Text en © 2013 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Mohsin, Kaji Muhammad
Srivastava, Ashok
Sharma, Ashwani K.
Mayberry, Clay
A Thermal Model for Carbon Nanotube Interconnects
title A Thermal Model for Carbon Nanotube Interconnects
title_full A Thermal Model for Carbon Nanotube Interconnects
title_fullStr A Thermal Model for Carbon Nanotube Interconnects
title_full_unstemmed A Thermal Model for Carbon Nanotube Interconnects
title_short A Thermal Model for Carbon Nanotube Interconnects
title_sort thermal model for carbon nanotube interconnects
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5327885/
https://www.ncbi.nlm.nih.gov/pubmed/28348333
http://dx.doi.org/10.3390/nano3020229
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