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Coherent Light Photo-modification, Mass Transport Effect, and Surface Relief Formation in As(x)S(100-x) Nanolayers: Absorption Edge, XPS, and Raman Spectroscopy Combined with Profilometry Study
As(x)S(100-x) (x = 40, 45, 50) thin films top surface nanolayers affected by green (532 nm) diode laser illumination have been studied by high-resolution X-ray photoelectron spectroscopy, Raman spectroscopy, optical spectroscopy, and surface profilometry. It is shown that the composition of obtained...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer US
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5328885/ https://www.ncbi.nlm.nih.gov/pubmed/28249365 http://dx.doi.org/10.1186/s11671-017-1918-y |