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Simulating and optimizing compound refractive lens-based X-ray microscopes

A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical im...

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Autores principales: Simons, Hugh, Ahl, Sonja Rosenlund, Poulsen, Henning Friis, Detlefs, Carsten
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5330290/
https://www.ncbi.nlm.nih.gov/pubmed/28244432
http://dx.doi.org/10.1107/S160057751602049X
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author Simons, Hugh
Ahl, Sonja Rosenlund
Poulsen, Henning Friis
Detlefs, Carsten
author_facet Simons, Hugh
Ahl, Sonja Rosenlund
Poulsen, Henning Friis
Detlefs, Carsten
author_sort Simons, Hugh
collection PubMed
description A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, spatial acceptance (vignetting), chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. These expressions show that the numerical aperture will be maximized and chromatic aberration will be minimized at the thick-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes.
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spelling pubmed-53302902017-03-01 Simulating and optimizing compound refractive lens-based X-ray microscopes Simons, Hugh Ahl, Sonja Rosenlund Poulsen, Henning Friis Detlefs, Carsten J Synchrotron Radiat Research Papers A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, spatial acceptance (vignetting), chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. These expressions show that the numerical aperture will be maximized and chromatic aberration will be minimized at the thick-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes. International Union of Crystallography 2017-02-20 /pmc/articles/PMC5330290/ /pubmed/28244432 http://dx.doi.org/10.1107/S160057751602049X Text en © Hugh Simons et al. 2017 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/
spellingShingle Research Papers
Simons, Hugh
Ahl, Sonja Rosenlund
Poulsen, Henning Friis
Detlefs, Carsten
Simulating and optimizing compound refractive lens-based X-ray microscopes
title Simulating and optimizing compound refractive lens-based X-ray microscopes
title_full Simulating and optimizing compound refractive lens-based X-ray microscopes
title_fullStr Simulating and optimizing compound refractive lens-based X-ray microscopes
title_full_unstemmed Simulating and optimizing compound refractive lens-based X-ray microscopes
title_short Simulating and optimizing compound refractive lens-based X-ray microscopes
title_sort simulating and optimizing compound refractive lens-based x-ray microscopes
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5330290/
https://www.ncbi.nlm.nih.gov/pubmed/28244432
http://dx.doi.org/10.1107/S160057751602049X
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