Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

Scanning transmission electron microscopy (STEM) was successfully applied to the analysis of silicon nanowires (SiNWs) that were self-assembled during an inductively coupled plasma (ICP) process. The ICP-synthesized SiNWs were found to present a Si–SiO(2) core–shell structure and length varying from...

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Detalles Bibliográficos
Autores principales: Agati, Marta, Amiard, Guillaume, Borgne, Vincent Le, Castrucci, Paola, Dolbec, Richard, De Crescenzi, Maurizio, El Khakani, My Alì, Boninelli, Simona
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2017
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5331248/
https://www.ncbi.nlm.nih.gov/pubmed/28326234
http://dx.doi.org/10.3762/bjnano.8.47

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5331248/
https://www.ncbi.nlm.nih.gov/pubmed/28326234
http://dx.doi.org/10.3762/bjnano.8.47

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