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Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures
[Image: see text] Nanoscale materials are promising for optoelectronic devices because their physical dimensions are on the order of the wavelength of light. This leads to a variety of complex optical phenomena that, for instance, enhance absorption and emission. However, quantifying the performance...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American
Chemical Society
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5333184/ https://www.ncbi.nlm.nih.gov/pubmed/28056171 http://dx.doi.org/10.1021/acsnano.6b06534 |