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Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates fr...

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Autores principales: Sang, Xiahan, Lupini, Andrew R., Ding, Jilai, Kalinin, Sergei V., Jesse, Stephen, Unocic, Raymond R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5341089/
https://www.ncbi.nlm.nih.gov/pubmed/28272404
http://dx.doi.org/10.1038/srep43585
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author Sang, Xiahan
Lupini, Andrew R.
Ding, Jilai
Kalinin, Sergei V.
Jesse, Stephen
Unocic, Raymond R.
author_facet Sang, Xiahan
Lupini, Andrew R.
Ding, Jilai
Kalinin, Sergei V.
Jesse, Stephen
Unocic, Raymond R.
author_sort Sang, Xiahan
collection PubMed
description Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i.e. image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials.
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spelling pubmed-53410892017-03-10 Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways Sang, Xiahan Lupini, Andrew R. Ding, Jilai Kalinin, Sergei V. Jesse, Stephen Unocic, Raymond R. Sci Rep Article Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates from the assigned location depending on the properties of the deflectors. To reduce these deviations, i.e. image distortions, we use spiral scanning paths, allowing precise control of a sub-Å sized electron probe within an aberration-corrected STEM. Although spiral scanning avoids the sudden changes in the beam location (fly-back distortion) present in conventional raster scans, it is not distortion-free. “Archimedean” spirals, with a constant angular frequency within each scan, are used to determine the characteristic response at different frequencies. We then show that such characteristic functions can be used to correct image distortions present in more complicated constant linear velocity spirals, where the frequency varies within each scan. Through the combined application of constant linear velocity scanning and beam path corrections, spiral scan images are shown to exhibit less scan distortion than conventional raster scan images. The methodology presented here will be useful for in situ STEM imaging at higher temporal resolution and for imaging beam sensitive materials. Nature Publishing Group 2017-03-08 /pmc/articles/PMC5341089/ /pubmed/28272404 http://dx.doi.org/10.1038/srep43585 Text en Copyright © 2017, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Sang, Xiahan
Lupini, Andrew R.
Ding, Jilai
Kalinin, Sergei V.
Jesse, Stephen
Unocic, Raymond R.
Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title_full Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title_fullStr Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title_full_unstemmed Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title_short Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
title_sort precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5341089/
https://www.ncbi.nlm.nih.gov/pubmed/28272404
http://dx.doi.org/10.1038/srep43585
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