Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways

Atomic-resolution imaging in an aberration-corrected scanning transmission electron microscope (STEM) can enable direct correlation between atomic structure and materials functionality. The fast and precise control of the STEM probe is, however, challenging because the true beam location deviates fr...

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Detalles Bibliográficos
Autores principales: Sang, Xiahan, Lupini, Andrew R., Ding, Jilai, Kalinin, Sergei V., Jesse, Stephen, Unocic, Raymond R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5341089/
https://www.ncbi.nlm.nih.gov/pubmed/28272404
http://dx.doi.org/10.1038/srep43585

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