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Statistics of localized phase slips in tunable width planar point contacts

The main dissipation mechanism in superconducting nanowires arises from phase slips. Thus far, most of the studies focus on long nanowires where coexisting events appear randomly along the nanowire. In the present work we investigate highly confined phase slips at the contact point of two supercondu...

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Autores principales: Baumans, Xavier D.A., Zharinov, Vyacheslav S., Raymenants, Eline, Blanco Alvarez, Sylvain, Scheerder, Jeroen E., Brisbois, Jérémy, Massarotti, Davide, Caruso, Roberta, Tafuri, Francesco, Janssens, Ewald, Moshchalkov, Victor V., Van de Vondel, Joris, Silhanek, Alejandro V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5353587/
https://www.ncbi.nlm.nih.gov/pubmed/28300182
http://dx.doi.org/10.1038/srep44569
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author Baumans, Xavier D.A.
Zharinov, Vyacheslav S.
Raymenants, Eline
Blanco Alvarez, Sylvain
Scheerder, Jeroen E.
Brisbois, Jérémy
Massarotti, Davide
Caruso, Roberta
Tafuri, Francesco
Janssens, Ewald
Moshchalkov, Victor V.
Van de Vondel, Joris
Silhanek, Alejandro V.
author_facet Baumans, Xavier D.A.
Zharinov, Vyacheslav S.
Raymenants, Eline
Blanco Alvarez, Sylvain
Scheerder, Jeroen E.
Brisbois, Jérémy
Massarotti, Davide
Caruso, Roberta
Tafuri, Francesco
Janssens, Ewald
Moshchalkov, Victor V.
Van de Vondel, Joris
Silhanek, Alejandro V.
author_sort Baumans, Xavier D.A.
collection PubMed
description The main dissipation mechanism in superconducting nanowires arises from phase slips. Thus far, most of the studies focus on long nanowires where coexisting events appear randomly along the nanowire. In the present work we investigate highly confined phase slips at the contact point of two superconducting leads. Profiting from the high current crowding at this spot, we are able to shrink in-situ the nanoconstriction. This procedure allows us to investigate, in the very same sample, thermally activated phase slips and the probability density function of the switching current I(sw) needed to trigger an avalanche of events. Furthermore, for an applied current larger than I(sw), we unveil the existence of two distinct thermal regimes. One corresponding to efficient heat removal where the constriction and bath temperatures remain close to each other, and another one in which the constriction temperature can be substantially larger than the bath temperature leading to the formation of a hot spot. Considering that the switching current distribution depends on the exact thermal properties of the sample, the identification of different thermal regimes is of utmost importance for properly interpreting the dissipation mechanisms in narrow point contacts.
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spelling pubmed-53535872017-03-20 Statistics of localized phase slips in tunable width planar point contacts Baumans, Xavier D.A. Zharinov, Vyacheslav S. Raymenants, Eline Blanco Alvarez, Sylvain Scheerder, Jeroen E. Brisbois, Jérémy Massarotti, Davide Caruso, Roberta Tafuri, Francesco Janssens, Ewald Moshchalkov, Victor V. Van de Vondel, Joris Silhanek, Alejandro V. Sci Rep Article The main dissipation mechanism in superconducting nanowires arises from phase slips. Thus far, most of the studies focus on long nanowires where coexisting events appear randomly along the nanowire. In the present work we investigate highly confined phase slips at the contact point of two superconducting leads. Profiting from the high current crowding at this spot, we are able to shrink in-situ the nanoconstriction. This procedure allows us to investigate, in the very same sample, thermally activated phase slips and the probability density function of the switching current I(sw) needed to trigger an avalanche of events. Furthermore, for an applied current larger than I(sw), we unveil the existence of two distinct thermal regimes. One corresponding to efficient heat removal where the constriction and bath temperatures remain close to each other, and another one in which the constriction temperature can be substantially larger than the bath temperature leading to the formation of a hot spot. Considering that the switching current distribution depends on the exact thermal properties of the sample, the identification of different thermal regimes is of utmost importance for properly interpreting the dissipation mechanisms in narrow point contacts. Nature Publishing Group 2017-03-16 /pmc/articles/PMC5353587/ /pubmed/28300182 http://dx.doi.org/10.1038/srep44569 Text en Copyright © 2017, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Baumans, Xavier D.A.
Zharinov, Vyacheslav S.
Raymenants, Eline
Blanco Alvarez, Sylvain
Scheerder, Jeroen E.
Brisbois, Jérémy
Massarotti, Davide
Caruso, Roberta
Tafuri, Francesco
Janssens, Ewald
Moshchalkov, Victor V.
Van de Vondel, Joris
Silhanek, Alejandro V.
Statistics of localized phase slips in tunable width planar point contacts
title Statistics of localized phase slips in tunable width planar point contacts
title_full Statistics of localized phase slips in tunable width planar point contacts
title_fullStr Statistics of localized phase slips in tunable width planar point contacts
title_full_unstemmed Statistics of localized phase slips in tunable width planar point contacts
title_short Statistics of localized phase slips in tunable width planar point contacts
title_sort statistics of localized phase slips in tunable width planar point contacts
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5353587/
https://www.ncbi.nlm.nih.gov/pubmed/28300182
http://dx.doi.org/10.1038/srep44569
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