On the determination of χ((2)) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies

The determination of the second-order susceptibility (χ((2))) of thin film samples can be a delicate matter since well-established χ((2)) measurement methodologies such as the Maker fringe technique are best suited for nonlinear materials with large thicknesses typically ranging from tens of microns...

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Detalles Bibliográficos
Autores principales: Hermans, Artur, Kieninger, Clemens, Koskinen, Kalle, Wickberg, Andreas, Solano, Eduardo, Dendooven, Jolien, Kauranen, Martti, Clemmen, Stéphane, Wegener, Martin, Koos, Christian, Baets, Roel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5357890/
https://www.ncbi.nlm.nih.gov/pubmed/28317938
http://dx.doi.org/10.1038/srep44581

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5357890/
https://www.ncbi.nlm.nih.gov/pubmed/28317938
http://dx.doi.org/10.1038/srep44581

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