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On the determination of χ((2)) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies
The determination of the second-order susceptibility (χ((2))) of thin film samples can be a delicate matter since well-established χ((2)) measurement methodologies such as the Maker fringe technique are best suited for nonlinear materials with large thicknesses typically ranging from tens of microns...
| Autores principales: | , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5357890/ https://www.ncbi.nlm.nih.gov/pubmed/28317938 http://dx.doi.org/10.1038/srep44581 |