Thin-film metallic glass: an effective diffusion barrier for Se-doped AgSbTe(2) thermoelectric modules

The thermal stability of joints in thermoelectric (TE) modules, which are degraded during interdiffusion between the TE material and the contacting metal, needs to be addressed in order to utilize TE technology for competitive, sustainable energy applications. Herein, we deposit a 200 nm-thick Zr-ba...

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Detalles Bibliográficos
Autores principales: Yu, Chia-Chi, Wu, Hsin-jay, Deng, Ping-Yuan, Agne, Matthias T., Snyder, G. Jeffrey, Chu, Jinn P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5361086/
https://www.ncbi.nlm.nih.gov/pubmed/28327655
http://dx.doi.org/10.1038/srep45177

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5361086/
https://www.ncbi.nlm.nih.gov/pubmed/28327655
http://dx.doi.org/10.1038/srep45177

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