Cargando…
Strongly Enhanced Piezoelectric Response in Lead Zirconate Titanate Films with Vertically Aligned Columnar Grains
[Image: see text] Pb(Zr(0.52)Ti(0.48))O(3) (PZT) films with (001) orientation were deposited on Pt(111)/Ti/SiO(2)/Si(100) substrates using pulsed laser deposition. Variation of the laser pulse rate during the deposition of the PZT films was found to play a key role in the control of the microstructu...
Autores principales: | Nguyen, Minh D., Houwman, Evert P., Dekkers, Matthijn, Rijnders, Guus |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American
Chemical Society
2017
|
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5364435/ https://www.ncbi.nlm.nih.gov/pubmed/28247756 http://dx.doi.org/10.1021/acsami.6b16470 |
Ejemplares similares
-
Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr(0.45)Ti(0.55)O(3) thin films on silicon in relation to grain tilt
por: Houwman, Evert P, et al.
Publicado: (2013) -
Large piezoelectric strain with ultra-low strain hysteresis in highly c-axis oriented Pb(Zr(0.52)Ti(0.48))O(3) films with columnar growth on amorphous glass substrates
por: Nguyen, Minh D., et al.
Publicado: (2017) -
Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates
por: Chopra, Anuj, et al.
Publicado: (2017) -
Controlling
Piezoelectric Responses in Pb(Zr(0.52)Ti(0.48))O(3) Films through Deposition Conditions
and Nanosheet Buffer Layers on Glass
por: Nguyen, Minh D., et al.
Publicado: (2017) -
Properties of epitaxial, (001)- and (110)-oriented (PbMg(1/3)Nb(2/3)O(3))(2/3)-(PbTiO(3))(1/3) films on silicon described by polarization rotation
por: Boota, Muhammad, et al.
Publicado: (2016)