Twin domain imaging in topological insulator Bi(2)Te(3) and Bi(2)Se(3) epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

The twin distribution in topological insulators Bi(2)Te(3) and Bi(2)Se(3) was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangu...

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Detalles Bibliográficos
Autores principales: Kriegner, Dominik, Harcuba, Petr, Veselý, Jozef, Lesnik, Andreas, Bauer, Guenther, Springholz, Gunther, Holý, Václav
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377339/
https://www.ncbi.nlm.nih.gov/pubmed/28381969
http://dx.doi.org/10.1107/S1600576717000565

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