Cargando…
NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering
The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary...
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2017
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377342/ https://www.ncbi.nlm.nih.gov/pubmed/28381972 http://dx.doi.org/10.1107/S1600576717001972 |
_version_ | 1782519296689176576 |
---|---|
author | Allen, Andrew J. Zhang, Fan Kline, R. Joseph Guthrie, William F. Ilavsky, Jan |
author_facet | Allen, Andrew J. Zhang, Fan Kline, R. Joseph Guthrie, William F. Ilavsky, Jan |
author_sort | Allen, Andrew J. |
collection | PubMed |
description | The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certified Q range, Q = 0.008–0.25 Å(−1), together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification. |
format | Online Article Text |
id | pubmed-5377342 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-53773422017-04-05 NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering Allen, Andrew J. Zhang, Fan Kline, R. Joseph Guthrie, William F. Ilavsky, Jan J Appl Crystallogr Research Papers The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certified Q range, Q = 0.008–0.25 Å(−1), together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification. International Union of Crystallography 2017-03-07 /pmc/articles/PMC5377342/ /pubmed/28381972 http://dx.doi.org/10.1107/S1600576717001972 Text en © Andrew J. Allen et al. 2017 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/ |
spellingShingle | Research Papers Allen, Andrew J. Zhang, Fan Kline, R. Joseph Guthrie, William F. Ilavsky, Jan NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title | NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title_full | NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title_fullStr | NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title_full_unstemmed | NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title_short | NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering |
title_sort | nist standard reference material 3600: absolute intensity calibration standard for small-angle x-ray scattering |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377342/ https://www.ncbi.nlm.nih.gov/pubmed/28381972 http://dx.doi.org/10.1107/S1600576717001972 |
work_keys_str_mv | AT allenandrewj niststandardreferencematerial3600absoluteintensitycalibrationstandardforsmallanglexrayscattering AT zhangfan niststandardreferencematerial3600absoluteintensitycalibrationstandardforsmallanglexrayscattering AT klinerjoseph niststandardreferencematerial3600absoluteintensitycalibrationstandardforsmallanglexrayscattering AT guthriewilliamf niststandardreferencematerial3600absoluteintensitycalibrationstandardforsmallanglexrayscattering AT ilavskyjan niststandardreferencematerial3600absoluteintensitycalibrationstandardforsmallanglexrayscattering |