Scanning X-ray nanodiffraction from ferroelectric domains in strained K(0.75)Na(0.25)NbO(3) epitaxial films grown on (110) TbScO(3)

Scanning X-ray nanodiffraction on a highly periodic ferroelectric domain pattern of a strained K(0.75)Na(0.25)NbO(3) epitaxial layer has been performed by using a focused X-ray beam of about 100 nm probe size. A 90°-rotated domain variant which is aligned along [1[Image: see text]2](TSO) has been found in addition to the predominant domain variant where the domains are aligned along the [[Image: see text]12](TSO) direction of the underlying (110) TbScO(3) (TSO) orthorhombic substrate. Owing to the larger elastic strain energy density, the 90°-rotated domains appear with significantly reduced probability. Furthermore, the 90°-rotated variant shows a larger vertical lattice spacing than the 0°-rotated domain variant. Calculations based on linear elasticity theory substantiate that this difference is caused by the elastic anisotropy of the K(0.75)Na(0.25)NbO(3) epitaxial layer.