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Scanning X-ray nanodiffraction from ferroelectric domains in strained K(0.75)Na(0.25)NbO(3) epitaxial films grown on (110) TbScO(3)

Scanning X-ray nanodiffraction on a highly periodic ferroelectric domain pattern of a strained K(0.75)Na(0.25)NbO(3) epitaxial layer has been performed by using a focused X-ray beam of about 100 nm probe size. A 90°-rotated domain variant which is aligned along [1[Image: see text]2](TSO) has been fo...

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Detalles Bibliográficos
Autores principales:	Schmidbauer, Martin, Hanke, Michael, Kwasniewski, Albert, Braun, Dorothee, von Helden, Leonard, Feldt, Christoph, Leake, Steven John, Schwarzkopf, Jutta
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2017
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377345/ https://www.ncbi.nlm.nih.gov/pubmed/28381975 http://dx.doi.org/10.1107/S1600576717000905

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