Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis

A simple and fast method was developed to determine the quantum efficiency and short circuit current of thin-film silicon solar cells prepared on periodically or randomly textured surfaces. The optics was studied for microcrystalline thin-film silicon solar cells with integrated periodic and random...

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Detalles Bibliográficos
Autores principales: Dewan, Rahul, Jovanov, Vladislav, Hamraz, Saeed, Knipp, Dietmar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5381427/
https://www.ncbi.nlm.nih.gov/pubmed/25112301
http://dx.doi.org/10.1038/srep06029
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author Dewan, Rahul
Jovanov, Vladislav
Hamraz, Saeed
Knipp, Dietmar
author_facet Dewan, Rahul
Jovanov, Vladislav
Hamraz, Saeed
Knipp, Dietmar
author_sort Dewan, Rahul
collection PubMed
description A simple and fast method was developed to determine the quantum efficiency and short circuit current of thin-film silicon solar cells prepared on periodically or randomly textured surfaces. The optics was studied for microcrystalline thin-film silicon solar cells with integrated periodic and random surface textures. Rigorous Coupled Wave Analysis (RCWA) was used to investigate the behaviour of the solar cells. The analysis of the periodic and random textured substrates allows for deriving optimal surface textures. Furthermore, light trapping in periodic and randomly textured substrates will be compared.
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spelling pubmed-53814272017-04-11 Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis Dewan, Rahul Jovanov, Vladislav Hamraz, Saeed Knipp, Dietmar Sci Rep Article A simple and fast method was developed to determine the quantum efficiency and short circuit current of thin-film silicon solar cells prepared on periodically or randomly textured surfaces. The optics was studied for microcrystalline thin-film silicon solar cells with integrated periodic and random surface textures. Rigorous Coupled Wave Analysis (RCWA) was used to investigate the behaviour of the solar cells. The analysis of the periodic and random textured substrates allows for deriving optimal surface textures. Furthermore, light trapping in periodic and randomly textured substrates will be compared. Nature Publishing Group 2014-08-12 /pmc/articles/PMC5381427/ /pubmed/25112301 http://dx.doi.org/10.1038/srep06029 Text en Copyright © 2014, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/4.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/4.0/
spellingShingle Article
Dewan, Rahul
Jovanov, Vladislav
Hamraz, Saeed
Knipp, Dietmar
Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title_full Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title_fullStr Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title_full_unstemmed Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title_short Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis
title_sort analyzing periodic and random textured silicon thin film solar cells by rigorous coupled wave analysis
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5381427/
https://www.ncbi.nlm.nih.gov/pubmed/25112301
http://dx.doi.org/10.1038/srep06029
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