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Surface improvement of organic photoresists using a near-field-dependent etching method

Surface flattening techniques are extremely important for the development of future electrical and/or optical devices because carrier-scattering losses due to surface roughness severely limit the performance of nanoscale devices. To address the problem, we have developed a near-field etching techniq...

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Detalles Bibliográficos
Autores principales: Brandenburg, Felix J, Okamoto, Tomohiro, Saito, Hiroshi, Leuschel, Benjamin, Soppera, Olivier, Yatsui, Takashi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5389175/
https://www.ncbi.nlm.nih.gov/pubmed/28487821
http://dx.doi.org/10.3762/bjnano.8.81