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Selective control of electron and hole tunneling in 2D assembly

Recent discoveries in the field of two-dimensional (2D) materials have led to the demonstration of exotic devices. Although they have new potential applications in electronics, thermally activated transport over a metal/semiconductor barrier sets physical subthermionic limitations. The challenge of...

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Detalles Bibliográficos
Autores principales: Chu, Dongil, Lee, Young Hee, Kim, Eun Kyu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Association for the Advancement of Science 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5397133/
https://www.ncbi.nlm.nih.gov/pubmed/28439554
http://dx.doi.org/10.1126/sciadv.1602726
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author Chu, Dongil
Lee, Young Hee
Kim, Eun Kyu
author_facet Chu, Dongil
Lee, Young Hee
Kim, Eun Kyu
author_sort Chu, Dongil
collection PubMed
description Recent discoveries in the field of two-dimensional (2D) materials have led to the demonstration of exotic devices. Although they have new potential applications in electronics, thermally activated transport over a metal/semiconductor barrier sets physical subthermionic limitations. The challenge of realizing an innovative transistor geometry that exploits this concern remains. A new class of 2D assembly (namely, “carristor”) with a configuration similar to the metal-insulator-semiconductor structure is introduced in this work. Superior functionalities, such as a current rectification ratio of up to 400,000 and a switching ratio of higher than 10(6) at room temperature, are realized by quantum-mechanical tunneling of majority and minority carriers across the barrier. These carristors have a potential application as the fundamental building block of low–power consumption electronics.
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spelling pubmed-53971332017-04-24 Selective control of electron and hole tunneling in 2D assembly Chu, Dongil Lee, Young Hee Kim, Eun Kyu Sci Adv Research Articles Recent discoveries in the field of two-dimensional (2D) materials have led to the demonstration of exotic devices. Although they have new potential applications in electronics, thermally activated transport over a metal/semiconductor barrier sets physical subthermionic limitations. The challenge of realizing an innovative transistor geometry that exploits this concern remains. A new class of 2D assembly (namely, “carristor”) with a configuration similar to the metal-insulator-semiconductor structure is introduced in this work. Superior functionalities, such as a current rectification ratio of up to 400,000 and a switching ratio of higher than 10(6) at room temperature, are realized by quantum-mechanical tunneling of majority and minority carriers across the barrier. These carristors have a potential application as the fundamental building block of low–power consumption electronics. American Association for the Advancement of Science 2017-04-19 /pmc/articles/PMC5397133/ /pubmed/28439554 http://dx.doi.org/10.1126/sciadv.1602726 Text en Copyright © 2017, The Authors http://creativecommons.org/licenses/by-nc/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial license (http://creativecommons.org/licenses/by-nc/4.0/) , which permits use, distribution, and reproduction in any medium, so long as the resultant use is not for commercial advantage and provided the original work is properly cited.
spellingShingle Research Articles
Chu, Dongil
Lee, Young Hee
Kim, Eun Kyu
Selective control of electron and hole tunneling in 2D assembly
title Selective control of electron and hole tunneling in 2D assembly
title_full Selective control of electron and hole tunneling in 2D assembly
title_fullStr Selective control of electron and hole tunneling in 2D assembly
title_full_unstemmed Selective control of electron and hole tunneling in 2D assembly
title_short Selective control of electron and hole tunneling in 2D assembly
title_sort selective control of electron and hole tunneling in 2d assembly
topic Research Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5397133/
https://www.ncbi.nlm.nih.gov/pubmed/28439554
http://dx.doi.org/10.1126/sciadv.1602726
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