Paramagnetic Intrinsic Defects in Polycrystalline Large-Area 2D MoS(2) Films Grown on SiO(2) by Mo Sulfurization

A low-temperature electron spin resonance study has been carried out on large-area high-purity polycrystalline two-dimensional few monolayer (ML) 2H MoS(2) films synthesized by sulfurization of Mo layers, with intent to atomically assess mobility-degrading detrimental point defects. This reveals the presence of a distinct previously unreported anisotropic defect of axial symmetry about the c-axis characterized by g (//) = 2.00145 and g (⊥) = 2.0027, with corresponding density (spin S = ½) ~3 × 10(12) cm(−2) for a 4 ML thick film. Inverse correlation of the defect density with grain size points to a domain boundary associated defect, inherently incorporated during sample growth. Based on the analysis of ESR signal features in combination with literature data, the signal is tentatively ascribed to the a (di)sulfur antisite defect (S or S(2) substituting for a Mo atom). Beset by these defects, the grain boundaries thus emerge as an intolerable threat for the carrier mobility and layer functionality.