Paramagnetic Intrinsic Defects in Polycrystalline Large-Area 2D MoS(2) Films Grown on SiO(2) by Mo Sulfurization

A low-temperature electron spin resonance study has been carried out on large-area high-purity polycrystalline two-dimensional few monolayer (ML) 2H MoS(2) films synthesized by sulfurization of Mo layers, with intent to atomically assess mobility-degrading detrimental point defects. This reveals the...

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Detalles Bibliográficos
Autores principales: Stesmans, A., Iacovo, S., Chiappe, D., Radu, I., Huyghebaert, C., De Gendt, S., Afanas’ev, V. V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2017
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5398968/
https://www.ncbi.nlm.nih.gov/pubmed/28431460
http://dx.doi.org/10.1186/s11671-017-2008-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5398968/
https://www.ncbi.nlm.nih.gov/pubmed/28431460
http://dx.doi.org/10.1186/s11671-017-2008-x

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