Ultrafast electron microscopy integrated with a direct electron detection camera

In the past decade, we have witnessed the rapid growth of the field of ultrafast electron microscopy (UEM), which provides intuitive means to watch atomic and molecular motions of matter. Yet, because of the limited current of the pulsed electron beam resulting from space-charge effects, observation...

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Detalles Bibliográficos
Autores principales: Lee, Young Min, Kim, Young Jae, Kim, Ye-Jin, Kwon, Oh-Hoon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2017
Materias:
Ultrafast Structural Dynamics—A Tribute to Ahmed H. Zewail
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5422204/
https://www.ncbi.nlm.nih.gov/pubmed/28529964
http://dx.doi.org/10.1063/1.4983226

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5422204/
https://www.ncbi.nlm.nih.gov/pubmed/28529964
http://dx.doi.org/10.1063/1.4983226

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