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Progress in the Correlative Atomic Force Microscopy and Optical Microscopy

Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized mol...

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Detalles Bibliográficos
Autores principales: Zhou, Lulu, Cai, Mingjun, Tong, Ti, Wang, Hongda
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5426934/
https://www.ncbi.nlm.nih.gov/pubmed/28441775
http://dx.doi.org/10.3390/s17040938
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author Zhou, Lulu
Cai, Mingjun
Tong, Ti
Wang, Hongda
author_facet Zhou, Lulu
Cai, Mingjun
Tong, Ti
Wang, Hongda
author_sort Zhou, Lulu
collection PubMed
description Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non-specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single-molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy.
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spelling pubmed-54269342017-05-12 Progress in the Correlative Atomic Force Microscopy and Optical Microscopy Zhou, Lulu Cai, Mingjun Tong, Ti Wang, Hongda Sensors (Basel) Review Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non-specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single-molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy. MDPI 2017-04-24 /pmc/articles/PMC5426934/ /pubmed/28441775 http://dx.doi.org/10.3390/s17040938 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Review
Zhou, Lulu
Cai, Mingjun
Tong, Ti
Wang, Hongda
Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title_full Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title_fullStr Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title_full_unstemmed Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title_short Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
title_sort progress in the correlative atomic force microscopy and optical microscopy
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5426934/
https://www.ncbi.nlm.nih.gov/pubmed/28441775
http://dx.doi.org/10.3390/s17040938
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