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STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces
Scanning probe microscopy (SPM) techniques have had a great impact on research fields of surface science and nanotechnology during the last decades. They are used to investigate surfaces with scanning ranges between several 100 μm down to atomic resolution. Depending on experimental conditions, and...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5445822/ https://www.ncbi.nlm.nih.gov/pubmed/28883327 http://dx.doi.org/10.3390/ma3084196 |