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Scanning Electron Microscopy with Samples in an Electric Field

The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” with a strong electric field just above the sample surface. This mode offers a convenient tool for controlling the landing energy of electrons down to units or even fractions of electronvolts with onl...

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Detalles Bibliográficos
Autores principales:	Frank, Ludĕk, Hovorka, Miloš, Mikmeková, Šárka, Mikmeková, Eliška, Müllerová, Ilona, Pokorná, Zuzana
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2012
Materias:	Review
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5449051/ http://dx.doi.org/10.3390/ma5122731

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