Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond

Analysis of the induced stress on undoped and boron-doped diamond (BDD) thin films by confocal Raman microscopy is performed in this study to investigate its correlation with sample chemical composition and the substrate used during fabrication. Knowledge of this nature is very important to the issu...

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Detalles Bibliográficos
Autores principales: Bennet, Kevin E., Lee, Kendall H., Tomshine, Jonathan R., Sundin, Emma M., Kruchowski, James N., Durrer, William G., Manciu, Bianca M., Kouzani, Abbas, Manciu, Felicia S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455545/
http://dx.doi.org/10.3390/ma8052782

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455545/
http://dx.doi.org/10.3390/ma8052782

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