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Revisiting the Characterization of the Losses in Piezoelectric Materials from Impedance Spectroscopy at Resonance
Electronic devices using the piezoelectric effect contain piezoelectric materials: often crystals, but in many cases poled ferroelectric ceramics (piezoceramics), polymers or composites. On the one hand, these materials exhibit non-negligible losses, not only dielectric, but also mechanical and piez...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456465/ https://www.ncbi.nlm.nih.gov/pubmed/28787872 http://dx.doi.org/10.3390/ma9020072 |
Sumario: | Electronic devices using the piezoelectric effect contain piezoelectric materials: often crystals, but in many cases poled ferroelectric ceramics (piezoceramics), polymers or composites. On the one hand, these materials exhibit non-negligible losses, not only dielectric, but also mechanical and piezoelectric. In this work, we made simulations of the effect of the three types of losses in piezoelectric materials on the impedance spectrum at the resonance. We analyze independently each type of loss and show the differences among them. On the other hand, electrical and electronic engineers include piezoelectric sensors in electrical circuits to build devices and need electrical models of the sensor element. Frequently, material scientists and engineers use different languages, and the characteristic material coefficients do not have a straightforward translation to those specific electrical circuit components. To connect both fields of study, we propose the use of accurate methods of characterization from impedance measurements at electromechanical resonance that lead to determination of all types of losses, as an alternative to current standards. We introduce a simplified equivalent circuit model with electrical parameters that account for piezoceramic losses needed for the modeling and design of industrial applications. |
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