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Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications

This paper presents a study of the quartz fibrous filters used as a substrate for capturing the particulate matter (PM) present in the air. Although these substrates are widely used in environmental applications, their microstructure has been barely studied. The behavior of these devices during the...

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Autores principales: Suárez-Peña, Beatriz, Negral, Luis, Castrillón, Leonor, Megido, Laura, Marañón, Elena, Fernández-Nava, Yolanda
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456495/
https://www.ncbi.nlm.nih.gov/pubmed/28787908
http://dx.doi.org/10.3390/ma9020109
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author Suárez-Peña, Beatriz
Negral, Luis
Castrillón, Leonor
Megido, Laura
Marañón, Elena
Fernández-Nava, Yolanda
author_facet Suárez-Peña, Beatriz
Negral, Luis
Castrillón, Leonor
Megido, Laura
Marañón, Elena
Fernández-Nava, Yolanda
author_sort Suárez-Peña, Beatriz
collection PubMed
description This paper presents a study of the quartz fibrous filters used as a substrate for capturing the particulate matter (PM) present in the air. Although these substrates are widely used in environmental applications, their microstructure has been barely studied. The behavior of these devices during the filtration process was investigated in terms of their microstructure and the quartz fibers. Surface and cross sections were monitored. Scanning electronic microscopy with energy dispersive X-ray spectroscopy (SEM-EDX), imaging and stereology techniques were used as tools for this purpose. The results show that most of the quartz filter fibers have sizes that allow them to be classified as nanofibers. It was also observed that, while the mechanisms of the mechanical capture of particles via impaction, interception and diffusion operate simultaneously in the outer zones of the filter cross section, the mechanism of capture by impaction is virtually non-existent in the innermost zones. Particles between 0.1 and 0.5 μm are known to be the most difficult to have captured by means of fibrous substrates. The fibers in inner zones were highly efficient in capturing this type of particle.
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spelling pubmed-54564952017-07-28 Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications Suárez-Peña, Beatriz Negral, Luis Castrillón, Leonor Megido, Laura Marañón, Elena Fernández-Nava, Yolanda Materials (Basel) Article This paper presents a study of the quartz fibrous filters used as a substrate for capturing the particulate matter (PM) present in the air. Although these substrates are widely used in environmental applications, their microstructure has been barely studied. The behavior of these devices during the filtration process was investigated in terms of their microstructure and the quartz fibers. Surface and cross sections were monitored. Scanning electronic microscopy with energy dispersive X-ray spectroscopy (SEM-EDX), imaging and stereology techniques were used as tools for this purpose. The results show that most of the quartz filter fibers have sizes that allow them to be classified as nanofibers. It was also observed that, while the mechanisms of the mechanical capture of particles via impaction, interception and diffusion operate simultaneously in the outer zones of the filter cross section, the mechanism of capture by impaction is virtually non-existent in the innermost zones. Particles between 0.1 and 0.5 μm are known to be the most difficult to have captured by means of fibrous substrates. The fibers in inner zones were highly efficient in capturing this type of particle. MDPI 2016-02-11 /pmc/articles/PMC5456495/ /pubmed/28787908 http://dx.doi.org/10.3390/ma9020109 Text en © 2016 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons by Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Suárez-Peña, Beatriz
Negral, Luis
Castrillón, Leonor
Megido, Laura
Marañón, Elena
Fernández-Nava, Yolanda
Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title_full Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title_fullStr Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title_full_unstemmed Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title_short Imaging Techniques and Scanning Electron Microscopy as Tools for Characterizing a Si-Based Material Used in Air Monitoring Applications
title_sort imaging techniques and scanning electron microscopy as tools for characterizing a si-based material used in air monitoring applications
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456495/
https://www.ncbi.nlm.nih.gov/pubmed/28787908
http://dx.doi.org/10.3390/ma9020109
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