Flexural Capability of Patterned Transparent Conductive Substrate by Performing Electrical Measurements and Stress Simulations

The suitability of stacked thin films for next-generation display technology was analyzed based on their properties and geometrical designs to evaluate the mechanical reliability of transparent conducting thin films utilized in flexural displays. In general, the high bending stress induced by variou...

Descripción completa

Detalles Bibliográficos
Autores principales: Lee, Chang-Chun, Huang, Pei-Chen, Wang, Ko-Shun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456620/
https://www.ncbi.nlm.nih.gov/pubmed/28773969
http://dx.doi.org/10.3390/ma9100850

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456620/
https://www.ncbi.nlm.nih.gov/pubmed/28773969
http://dx.doi.org/10.3390/ma9100850

Ejemplares similares