Cargando…
Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy
All surfaces exposed to ambient conditions are covered by a thin film of water. Other than at high humidity conditions, i.e., relative humidity higher than 80%, those water films have nanoscale thickness. Nevertheless, even the thinnest film can profoundly affect the physical and chemical properties...
Autores principales: | Santos, Sergio, Verdaguer, Albert |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456730/ https://www.ncbi.nlm.nih.gov/pubmed/28773306 http://dx.doi.org/10.3390/ma9030182 |
Ejemplares similares
-
Unlocking higher harmonics in atomic force microscopy with gentle interactions
por: Santos, Sergio, et al.
Publicado: (2014) -
Accurate Atomic-Scale Imaging of Two-Dimensional Lattices Using Atomic Force Microscopy in Ambient Conditions
por: Kim, Sunghyun, et al.
Publicado: (2022) -
Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
por: Kang, Hua, et al.
Publicado: (2018) -
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy
por: Korolkov, Vladimir V., et al.
Publicado: (2019) -
Ultrahigh-resolution imaging of water networks by atomic force microscopy
por: Shiotari, Akitoshi, et al.
Publicado: (2017)