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Introduction to the special issue on high-resolution X-ray diffraction and imaging

The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016.

Detalles Bibliográficos
Autores principales: Chamard, Virginie, Holý, Václav
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458585/
https://www.ncbi.nlm.nih.gov/pubmed/28656031
http://dx.doi.org/10.1107/S1600576717007257

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