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Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction in multilayers and superlattices

Diffraction in multilayers in the presence of interfacial roughness is studied theoretically, the roughness being considered as a transition layer. Exact (within the framework of the two-beam dynamical diffraction theory) differential equations for field amplitudes in a crystalline structure with va...

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Detalles Bibliográficos
Autores principales: Lobach, Ihar, Benediktovitch, Andrei, Ulyanenkov, Alexander
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458587/
https://www.ncbi.nlm.nih.gov/pubmed/28656033
http://dx.doi.org/10.1107/S1600576717004137

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