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X-ray topography of subsurface crystal layers

New capabilities of the Berg–Barrett topographic method are demonstrated using a skew-asymmetric X-ray diffraction scheme for investigating structural changes near the surface of semiconductor materials. Specifying the X-ray extinction depth, the details of defects and strains are revealed with high...

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Detalles Bibliográficos
Autores principales:	Swiatek, Zbigniew, Fodchuk, Igor, Zaplitnyy, Ruslan
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2017
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458592/ https://www.ncbi.nlm.nih.gov/pubmed/28656038 http://dx.doi.org/10.1107/S1600576717007208

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