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Open-Source Automated Mapping Four-Point Probe

Scientists have begun using self-replicating rapid prototyper (RepRap) 3-D printers to manufacture open source digital designs of scientific equipment. This approach is refined here to develop a novel instrument capable of performing automated large-area four-point probe measurements. The designs fo...

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Autores principales: Chandra, Handy, Allen, Spencer W., Oberloier, Shane W., Bihari, Nupur, Gwamuri, Jephias, Pearce, Joshua M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5459207/
https://www.ncbi.nlm.nih.gov/pubmed/28772471
http://dx.doi.org/10.3390/ma10020110
_version_ 1783241930478452736
author Chandra, Handy
Allen, Spencer W.
Oberloier, Shane W.
Bihari, Nupur
Gwamuri, Jephias
Pearce, Joshua M.
author_facet Chandra, Handy
Allen, Spencer W.
Oberloier, Shane W.
Bihari, Nupur
Gwamuri, Jephias
Pearce, Joshua M.
author_sort Chandra, Handy
collection PubMed
description Scientists have begun using self-replicating rapid prototyper (RepRap) 3-D printers to manufacture open source digital designs of scientific equipment. This approach is refined here to develop a novel instrument capable of performing automated large-area four-point probe measurements. The designs for conversion of a RepRap 3-D printer to a 2-D open source four-point probe (OS4PP) measurement device are detailed for the mechanical and electrical systems. Free and open source software and firmware are developed to operate the tool. The OS4PP was validated against a wide range of discrete resistors and indium tin oxide (ITO) samples of different thicknesses both pre- and post-annealing. The OS4PP was then compared to two commercial proprietary systems. Results of resistors from 10 to 1 MΩ show errors of less than 1% for the OS4PP. The 3-D mapping of sheet resistance of ITO samples successfully demonstrated the automated capability to measure non-uniformities in large-area samples. The results indicate that all measured values are within the same order of magnitude when compared to two proprietary measurement systems. In conclusion, the OS4PP system, which costs less than 70% of manual proprietary systems, is comparable electrically while offering automated 100 micron positional accuracy for measuring sheet resistance over larger areas.
format Online
Article
Text
id pubmed-5459207
institution National Center for Biotechnology Information
language English
publishDate 2017
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-54592072017-07-28 Open-Source Automated Mapping Four-Point Probe Chandra, Handy Allen, Spencer W. Oberloier, Shane W. Bihari, Nupur Gwamuri, Jephias Pearce, Joshua M. Materials (Basel) Article Scientists have begun using self-replicating rapid prototyper (RepRap) 3-D printers to manufacture open source digital designs of scientific equipment. This approach is refined here to develop a novel instrument capable of performing automated large-area four-point probe measurements. The designs for conversion of a RepRap 3-D printer to a 2-D open source four-point probe (OS4PP) measurement device are detailed for the mechanical and electrical systems. Free and open source software and firmware are developed to operate the tool. The OS4PP was validated against a wide range of discrete resistors and indium tin oxide (ITO) samples of different thicknesses both pre- and post-annealing. The OS4PP was then compared to two commercial proprietary systems. Results of resistors from 10 to 1 MΩ show errors of less than 1% for the OS4PP. The 3-D mapping of sheet resistance of ITO samples successfully demonstrated the automated capability to measure non-uniformities in large-area samples. The results indicate that all measured values are within the same order of magnitude when compared to two proprietary measurement systems. In conclusion, the OS4PP system, which costs less than 70% of manual proprietary systems, is comparable electrically while offering automated 100 micron positional accuracy for measuring sheet resistance over larger areas. MDPI 2017-01-26 /pmc/articles/PMC5459207/ /pubmed/28772471 http://dx.doi.org/10.3390/ma10020110 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Chandra, Handy
Allen, Spencer W.
Oberloier, Shane W.
Bihari, Nupur
Gwamuri, Jephias
Pearce, Joshua M.
Open-Source Automated Mapping Four-Point Probe
title Open-Source Automated Mapping Four-Point Probe
title_full Open-Source Automated Mapping Four-Point Probe
title_fullStr Open-Source Automated Mapping Four-Point Probe
title_full_unstemmed Open-Source Automated Mapping Four-Point Probe
title_short Open-Source Automated Mapping Four-Point Probe
title_sort open-source automated mapping four-point probe
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5459207/
https://www.ncbi.nlm.nih.gov/pubmed/28772471
http://dx.doi.org/10.3390/ma10020110
work_keys_str_mv AT chandrahandy opensourceautomatedmappingfourpointprobe
AT allenspencerw opensourceautomatedmappingfourpointprobe
AT oberloiershanew opensourceautomatedmappingfourpointprobe
AT biharinupur opensourceautomatedmappingfourpointprobe
AT gwamurijephias opensourceautomatedmappingfourpointprobe
AT pearcejoshuam opensourceautomatedmappingfourpointprobe