Electric field imaging of single atoms

In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding ne...

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Detalles Bibliográficos
Autores principales: Shibata, Naoya, Seki, Takehito, Sánchez-Santolino, Gabriel, Findlay, Scott D., Kohno, Yuji, Matsumoto, Takao, Ishikawa, Ryo, Ikuhara, Yuichi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5459997/
https://www.ncbi.nlm.nih.gov/pubmed/28555629
http://dx.doi.org/10.1038/ncomms15631

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5459997/
https://www.ncbi.nlm.nih.gov/pubmed/28555629
http://dx.doi.org/10.1038/ncomms15631

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