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A Gradient-Field Pulsed Eddy Current Probe for Evaluation of Hidden Material Degradation in Conductive Structures Based on Lift-Off Invariance
Coated conductive structures are widely adopted in such engineering fields as aerospace, nuclear energy, etc. The hostile and corrosive environment leaves in-service coated conductive structures vulnerable to Hidden Material Degradation (HMD) occurring under the protection coating. It is highly dema...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5461067/ https://www.ncbi.nlm.nih.gov/pubmed/28441328 http://dx.doi.org/10.3390/s17050943 |
Sumario: | Coated conductive structures are widely adopted in such engineering fields as aerospace, nuclear energy, etc. The hostile and corrosive environment leaves in-service coated conductive structures vulnerable to Hidden Material Degradation (HMD) occurring under the protection coating. It is highly demanded that HMD can be non-intrusively assessed using non-destructive evaluation techniques. In light of the advantages of Gradient-field Pulsed Eddy Current technique (GPEC) over other non-destructive evaluation methods in corrosion evaluation, in this paper the GPEC probe for quantitative evaluation of HMD is intensively investigated. Closed-form expressions of GPEC responses to HMD are formulated via analytical modeling. The Lift-off Invariance (LOI) in GPEC signals, which makes the HMD evaluation immune to the variation in thickness of the protection coating, is introduced and analyzed through simulations involving HMD with variable depths and conductivities. A fast inverse method employing magnitude and time of the LOI point in GPEC signals for simultaneously evaluating the conductivity and thickness of HMD region is proposed, and subsequently verified by finite element modeling and experiments. It has been found from the results that along with the proposed inverse method the GPEC probe is applicable to evaluation of HMD in coated conductive structures without much loss in accuracy. |
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