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Defect Dominated Charge Transport and Fermi Level Pinning in MoS(2)/Metal Contacts

[Image: see text] Understanding the electronic contact between molybdenum disulfide (MoS(2)) and metal electrodes is vital for the realization of future MoS(2)-based electronic devices. Natural MoS(2) has the drawback of a high density of both metal and sulfur defects and impurities. We present evid...

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Detalles Bibliográficos
Autores principales: Bampoulis, Pantelis, van Bremen, Rik, Yao, Qirong, Poelsema, Bene, Zandvliet, Harold J. W., Sotthewes, Kai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5465510/
https://www.ncbi.nlm.nih.gov/pubmed/28508628
http://dx.doi.org/10.1021/acsami.7b02739

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