In situ polarization and dielectric property measurements of Pb(Zr(0.52)Ti(0.48))O(3) ferroelectric nanocrystals

Pb(Zr(0.52)Ti(0.48))O(3)/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD)...

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Detalles Bibliográficos
Autores principales: Zhai, Haifa, Jiang, Yurong, Li, Hongjing, Zhang, Panpan, He, Yixiao, Shi, Dandan, Zhang, Xiang, Yang, Jien
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5466590/
https://www.ncbi.nlm.nih.gov/pubmed/28626805
http://dx.doi.org/10.1016/j.heliyon.2017.e00313
Descripción
Sumario:Pb(Zr(0.52)Ti(0.48))O(3)/polycarbonate (PZT/PC) composite films with different concentration of PZT ferroelectric nanocrystals are prepared. The polarization and dielectric relaxation behavior of PZT ferroelectric nanocrystals are characterized using in situ transmittance and X-ray diffraction (XRD) measurements for the first time. It’s found that 10% PZT/PC composite film has the largest orientation change and negligible dielectric relaxation after poling (the φ value of 13.8% is almost constant with time even for 168 h). Based on the XRD results, we consider that the preferential orientation of PZT nanocrystals to align in PC matrix after poling is [001] direction.

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