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Finite Element Analysis of Film Stack Architecture for Complementary Metal-Oxide–Semiconductor Image Sensors

Image sensors are the core components of computer, communication, and consumer electronic products. Complementary metal oxide semiconductor (CMOS) image sensors have become the mainstay of image-sensing developments, but are prone to leakage current. In this study, we simulate the CMOS image sensor...

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Detalles Bibliográficos
Autores principales: Wu, Kuo-Tsai, Hwang, Sheng-Jye, Lee, Huei-Huang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5469527/
https://www.ncbi.nlm.nih.gov/pubmed/28468324
http://dx.doi.org/10.3390/s17051004