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Atomically engineered electron spin lifetimes of 30 s in silicon
Scaling up to large arrays of donor-based spin qubits for quantum computation will require the ability to perform high-fidelity readout of multiple individual spin qubits. Recent experiments have shown that the limiting factor for high-fidelity readout of many qubits is the lifetime of the electron...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Association for the Advancement of Science
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5477090/ https://www.ncbi.nlm.nih.gov/pubmed/29159289 http://dx.doi.org/10.1126/sciadv.1602811 |
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author | Watson, Thomas F. Weber, Bent Hsueh, Yu-Ling Hollenberg, Lloyd L. C. Rahman, Rajib Simmons, Michelle Y. |
author_facet | Watson, Thomas F. Weber, Bent Hsueh, Yu-Ling Hollenberg, Lloyd L. C. Rahman, Rajib Simmons, Michelle Y. |
author_sort | Watson, Thomas F. |
collection | PubMed |
description | Scaling up to large arrays of donor-based spin qubits for quantum computation will require the ability to perform high-fidelity readout of multiple individual spin qubits. Recent experiments have shown that the limiting factor for high-fidelity readout of many qubits is the lifetime of the electron spin. We demonstrate the longest reported lifetimes (up to 30 s) of any electron spin qubit in a nanoelectronic device. By atomic-level engineering of the electron wave function within phosphorus atom quantum dots, we can minimize spin relaxation in agreement with recent theoretical predictions. These lifetimes allow us to demonstrate the sequential readout of two electron spin qubits with fidelities as high as 99.8%, which is above the surface code fault-tolerant threshold. This work paves the way for future experiments on multiqubit systems using donors in silicon. |
format | Online Article Text |
id | pubmed-5477090 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | American Association for the Advancement of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-54770902017-11-20 Atomically engineered electron spin lifetimes of 30 s in silicon Watson, Thomas F. Weber, Bent Hsueh, Yu-Ling Hollenberg, Lloyd L. C. Rahman, Rajib Simmons, Michelle Y. Sci Adv Research Articles Scaling up to large arrays of donor-based spin qubits for quantum computation will require the ability to perform high-fidelity readout of multiple individual spin qubits. Recent experiments have shown that the limiting factor for high-fidelity readout of many qubits is the lifetime of the electron spin. We demonstrate the longest reported lifetimes (up to 30 s) of any electron spin qubit in a nanoelectronic device. By atomic-level engineering of the electron wave function within phosphorus atom quantum dots, we can minimize spin relaxation in agreement with recent theoretical predictions. These lifetimes allow us to demonstrate the sequential readout of two electron spin qubits with fidelities as high as 99.8%, which is above the surface code fault-tolerant threshold. This work paves the way for future experiments on multiqubit systems using donors in silicon. American Association for the Advancement of Science 2017-03-31 /pmc/articles/PMC5477090/ /pubmed/29159289 http://dx.doi.org/10.1126/sciadv.1602811 Text en Copyright © 2017, The Authors http://creativecommons.org/licenses/by-nc/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial license (http://creativecommons.org/licenses/by-nc/4.0/) , which permits use, distribution, and reproduction in any medium, so long as the resultant use is not for commercial advantage and provided the original work is properly cited. |
spellingShingle | Research Articles Watson, Thomas F. Weber, Bent Hsueh, Yu-Ling Hollenberg, Lloyd L. C. Rahman, Rajib Simmons, Michelle Y. Atomically engineered electron spin lifetimes of 30 s in silicon |
title | Atomically engineered electron spin lifetimes of 30 s in
silicon |
title_full | Atomically engineered electron spin lifetimes of 30 s in
silicon |
title_fullStr | Atomically engineered electron spin lifetimes of 30 s in
silicon |
title_full_unstemmed | Atomically engineered electron spin lifetimes of 30 s in
silicon |
title_short | Atomically engineered electron spin lifetimes of 30 s in
silicon |
title_sort | atomically engineered electron spin lifetimes of 30 s in
silicon |
topic | Research Articles |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5477090/ https://www.ncbi.nlm.nih.gov/pubmed/29159289 http://dx.doi.org/10.1126/sciadv.1602811 |
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