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A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism
Plated through hole (PTH) plays a critical role in printed circuit board (PCB) reliability. Thermal fatigue deformation of the PTH material is regarded as the primary factor affecting the lifetime of electrical devices. Numerous research efforts have focused on the failure mechanism model of PTH. Ho...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5506925/ https://www.ncbi.nlm.nih.gov/pubmed/28772743 http://dx.doi.org/10.3390/ma10040382 |
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author | Li, Yaqiu Hu, Weiwei Sun, Yufeng Wang, Zili Mosleh, Ali |
author_facet | Li, Yaqiu Hu, Weiwei Sun, Yufeng Wang, Zili Mosleh, Ali |
author_sort | Li, Yaqiu |
collection | PubMed |
description | Plated through hole (PTH) plays a critical role in printed circuit board (PCB) reliability. Thermal fatigue deformation of the PTH material is regarded as the primary factor affecting the lifetime of electrical devices. Numerous research efforts have focused on the failure mechanism model of PTH. However, most of the existing models were based on the one-dimensional structure hypothesis without taking the multilayered structure and external pad into consideration. In this paper, the constitutive relation of multilayered PTH is developed to establish the stress equation, and finite element analysis (FEA) is performed to locate the maximum stress and simulate the influence of the material properties. Finally, thermal cycle tests are conducted to verify the accuracy of the life prediction results. This model could be used in fatigue failure portable diagnosis and for life prediction of multilayered PCB. |
format | Online Article Text |
id | pubmed-5506925 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-55069252017-07-28 A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism Li, Yaqiu Hu, Weiwei Sun, Yufeng Wang, Zili Mosleh, Ali Materials (Basel) Article Plated through hole (PTH) plays a critical role in printed circuit board (PCB) reliability. Thermal fatigue deformation of the PTH material is regarded as the primary factor affecting the lifetime of electrical devices. Numerous research efforts have focused on the failure mechanism model of PTH. However, most of the existing models were based on the one-dimensional structure hypothesis without taking the multilayered structure and external pad into consideration. In this paper, the constitutive relation of multilayered PTH is developed to establish the stress equation, and finite element analysis (FEA) is performed to locate the maximum stress and simulate the influence of the material properties. Finally, thermal cycle tests are conducted to verify the accuracy of the life prediction results. This model could be used in fatigue failure portable diagnosis and for life prediction of multilayered PCB. MDPI 2017-04-04 /pmc/articles/PMC5506925/ /pubmed/28772743 http://dx.doi.org/10.3390/ma10040382 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Li, Yaqiu Hu, Weiwei Sun, Yufeng Wang, Zili Mosleh, Ali A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title | A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title_full | A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title_fullStr | A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title_full_unstemmed | A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title_short | A Life Prediction Model of Multilayered PTH Based on Fatigue Mechanism |
title_sort | life prediction model of multilayered pth based on fatigue mechanism |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5506925/ https://www.ncbi.nlm.nih.gov/pubmed/28772743 http://dx.doi.org/10.3390/ma10040382 |
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