Surface Characterization of Polymer Blends by XPS and ToF-SIMS

The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron s...

Descripción completa

Detalles Bibliográficos
Autores principales: Chan, Chi Ming, Weng, Lu-Tao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5509266/
https://www.ncbi.nlm.nih.gov/pubmed/28773777
http://dx.doi.org/10.3390/ma9080655
Descripción
Sumario:The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.

Ejemplares similares