Surface Characterization of Polymer Blends by XPS and ToF-SIMS

The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron s...

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Detalles Bibliográficos
Autores principales: Chan, Chi Ming, Weng, Lu-Tao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5509266/
https://www.ncbi.nlm.nih.gov/pubmed/28773777
http://dx.doi.org/10.3390/ma9080655
_version_ 1783249994873044992
author Chan, Chi Ming
Weng, Lu-Tao
author_facet Chan, Chi Ming
Weng, Lu-Tao
author_sort Chan, Chi Ming
collection PubMed
description The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.
format Online
Article
Text
id pubmed-5509266
institution National Center for Biotechnology Information
language English
publishDate 2016
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-55092662017-07-28 Surface Characterization of Polymer Blends by XPS and ToF-SIMS Chan, Chi Ming Weng, Lu-Tao Materials (Basel) Review The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends. MDPI 2016-08-04 /pmc/articles/PMC5509266/ /pubmed/28773777 http://dx.doi.org/10.3390/ma9080655 Text en © 2016 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Review
Chan, Chi Ming
Weng, Lu-Tao
Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title_full Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title_fullStr Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title_full_unstemmed Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title_short Surface Characterization of Polymer Blends by XPS and ToF-SIMS
title_sort surface characterization of polymer blends by xps and tof-sims
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5509266/
https://www.ncbi.nlm.nih.gov/pubmed/28773777
http://dx.doi.org/10.3390/ma9080655
work_keys_str_mv AT chanchiming surfacecharacterizationofpolymerblendsbyxpsandtofsims
AT wenglutao surfacecharacterizationofpolymerblendsbyxpsandtofsims

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