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A review of demodulation techniques for amplitude-modulation atomic force microscopy

In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of...

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Autores principales: Ruppert, Michael G, Harcombe, David M, Ragazzon, Michael R P, Moheimani, S O Reza, Fleming, Andrew J
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5530615/
https://www.ncbi.nlm.nih.gov/pubmed/28900596
http://dx.doi.org/10.3762/bjnano.8.142
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author Ruppert, Michael G
Harcombe, David M
Ragazzon, Michael R P
Moheimani, S O Reza
Fleming, Andrew J
author_facet Ruppert, Michael G
Harcombe, David M
Ragazzon, Michael R P
Moheimani, S O Reza
Fleming, Andrew J
author_sort Ruppert, Michael G
collection PubMed
description In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode atomic force microscopy experiments in constant-height mode.
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spelling pubmed-55306152017-09-12 A review of demodulation techniques for amplitude-modulation atomic force microscopy Ruppert, Michael G Harcombe, David M Ragazzon, Michael R P Moheimani, S O Reza Fleming, Andrew J Beilstein J Nanotechnol Review In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode atomic force microscopy experiments in constant-height mode. Beilstein-Institut 2017-07-10 /pmc/articles/PMC5530615/ /pubmed/28900596 http://dx.doi.org/10.3762/bjnano.8.142 Text en Copyright © 2017, Ruppert et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Review
Ruppert, Michael G
Harcombe, David M
Ragazzon, Michael R P
Moheimani, S O Reza
Fleming, Andrew J
A review of demodulation techniques for amplitude-modulation atomic force microscopy
title A review of demodulation techniques for amplitude-modulation atomic force microscopy
title_full A review of demodulation techniques for amplitude-modulation atomic force microscopy
title_fullStr A review of demodulation techniques for amplitude-modulation atomic force microscopy
title_full_unstemmed A review of demodulation techniques for amplitude-modulation atomic force microscopy
title_short A review of demodulation techniques for amplitude-modulation atomic force microscopy
title_sort review of demodulation techniques for amplitude-modulation atomic force microscopy
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5530615/
https://www.ncbi.nlm.nih.gov/pubmed/28900596
http://dx.doi.org/10.3762/bjnano.8.142
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